Keysight Unveils WaferPro Express 2015 Platform for Wafer-Level Device

Keysight Unveils WaferPro Express 2015 Platform for Wafer-Level Device
The new noise figure measurement capability further complements the software's existing gain compression, two-tone intermodulation distortion and S-parameter measurements currently available in the latest Keysight PNA-X instrument driver.
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NI Introduces Industry's Widest Bandwidth High-Performance Microwave Vector
This instrument addresses applications including blocking/interferer generation, high-performance intermodulation distortion test benches and various electronic warfare applications. “The NI 20 GHz PXI source offers an excellent combination of phase …
Read more on Yahoo Finance UK

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